Florida Institute for National Security (FINS)

Tag: SCAN Lab

AI Gatekeepers at UF Provide Innovative Tool for Industries Looking to Shut Down Bad Actors

August 23, 2022 in News, Slider

“Intellectual property infringement accounts for multiple billion dollars each year. But more importantly, this is a national security threat.”

ablation AI artificial intelligence chips compromised foundries computer vision cybersecurity deep learning deepfakes deposition design disguise Dr. Forte Dr. Woodard electrical & computer engineering facsimile fakes FIB focused ion beam HiPerGator IC security models IEC image analysis Inclusive Engineering Consortium intellectual property IP knockoffs malware microchips military equipment minorities nano-labs national security national security threat NSF outreach piracy recruit reverse engineering Ronald Wilson SCAN Lab Scanning Electron Microscope security clearance pipeline SEM semiconductor industry supercomputer supply chain supply chain disruption supply chain issues synthetic data threat. Trojan workforce development